Article
Addressing Leakage Power in VLSI Design: Strategies, Trends, and Future
Leakage power has emerged as a critical concern in VLSI design due to the relentless scaling of transistor dimensions and increasing transistor count on integrated circuits. As technology nodes continue to shrink, leakage power has become a dominant component of the overall power consumption, leading to performance degradation, reduced battery life, and increased heat dissipation. This review paper provides a comprehensive analysis of leakage power in VLSI design, focusing on its sources, challenges, and potential solutions. Various techniques for leakage power reduction at the circuit and architecture levels are discussed, including power gating, multi-threshold voltage techniques, supply voltage scaling, and process optimizations. Additionally, leakage power models and estimation methods are explored, along with trade-offs and design challenges associated with leakage power reduction. The paper also presents case studies and experimental results to illustrate the effectiveness of leakage power reduction techniques in practical designs. The insights provided in this review paper will aid researchers and practitioners in understanding the complexities of leakage power and making informed decisions during VLSI design to mitigate its adverse effects.
Full Text Attachment
